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Stimulated emission and ultrafast carrier relaxation in InGaN multiple quantum wells

Identifieur interne : 00C583 ( Main/Repository ); précédent : 00C582; suivant : 00C584

Stimulated emission and ultrafast carrier relaxation in InGaN multiple quantum wells

Auteurs : RBID : Pascal:03-0122995

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Abstract

Stimulated emission (SE) was measured from two InGaN multiple quantum well (MQW) laser structures with different QW In compositions x. SE threshold energy densities (Ith) increased with increasing x-dependent QW depth. Time-resolved differential transmission measurements mapped the carrier relaxation mechanisms and explained the dependence of Ith on x. Carriers are captured from the barriers to the QWs in <1 ps, while carrier recombination rates increased with increasing x. For excitation above Ith, an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing Ith. © 2003 American Institute of Physics.

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Pascal:03-0122995

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<div type="abstract" xml:lang="en">Stimulated emission (SE) was measured from two InGaN multiple quantum well (MQW) laser structures with different QW In compositions x. SE threshold energy densities (I
<sub>th</sub>
) increased with increasing x-dependent QW depth. Time-resolved differential transmission measurements mapped the carrier relaxation mechanisms and explained the dependence of I
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on x. Carriers are captured from the barriers to the QWs in <1 ps, while carrier recombination rates increased with increasing x. For excitation above I
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, an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing I
<sub>th</sub>
. © 2003 American Institute of Physics.</div>
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