Stimulated emission and ultrafast carrier relaxation in InGaN multiple quantum wells
Identifieur interne : 00C583 ( Main/Repository ); précédent : 00C582; suivant : 00C584Stimulated emission and ultrafast carrier relaxation in InGaN multiple quantum wells
Auteurs : RBID : Pascal:03-0122995Descripteurs français
- Pascal (Inist)
- 7867D, 4255P, 7845, 7867P, 7866F, 8107S, 8535B, 7321C, 7321F, 7847, 6150N, Etude expérimentale, Indium composé, Gallium composé, Semiconducteur III-V, Semiconducteur bande interdite large, Puits quantique semiconducteur, Superréseau semiconducteur, Laser puits quantique, Emission stimulée, Technique optique grande vitesse, Stoechiométrie, Recombinaison électron trou, Etat interface.
English descriptors
- KwdEn :
- Electron-hole recombination, Experimental study, Gallium compounds, High-speed optical techniques, III-V semiconductors, Indium compounds, Interface states, Quantum well lasers, Semiconductor quantum wells, Semiconductor superlattices, Stimulated emission, Stoichiometry, Wide band gap semiconductors.
Abstract
Stimulated emission (SE) was measured from two InGaN multiple quantum well (MQW) laser structures with different QW In compositions x. SE threshold energy densities (Ith) increased with increasing x-dependent QW depth. Time-resolved differential transmission measurements mapped the carrier relaxation mechanisms and explained the dependence of Ith on x. Carriers are captured from the barriers to the QWs in <1 ps, while carrier recombination rates increased with increasing x. For excitation above Ith, an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing Ith. © 2003 American Institute of Physics.
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<author><name sortKey="Ozgur, Umit" uniqKey="Ozgur U">Umit Ozgur</name>
<affiliation wicri:level="2"><inist:fA14 i1="01"><s1>Department of Physics, Duke University, Durham, North Carolina 27708</s1>
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<country xml:lang="fr">États-Unis</country>
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<wicri:cityArea>Department of Physics, Duke University, Durham</wicri:cityArea>
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<author><name sortKey="Everitt, Henry O" uniqKey="Everitt H">Henry O. Everitt</name>
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<author><name sortKey="Keller, Stacia" uniqKey="Keller S">Stacia Keller</name>
<affiliation wicri:level="2"><inist:fA14 i1="02"><s1>Department of Electrical Engineering and Materials Science, University of California, Santa Barbara, California 93106</s1>
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<author><name sortKey="Denbaars, Steven P" uniqKey="Denbaars S">Steven P. Denbaars</name>
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<term>Quantum well lasers</term>
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<term>Semiconductor superlattices</term>
<term>Stimulated emission</term>
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<term>Wide band gap semiconductors</term>
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<front><div type="abstract" xml:lang="en">Stimulated emission (SE) was measured from two InGaN multiple quantum well (MQW) laser structures with different QW In compositions x. SE threshold energy densities (I<sub>th</sub>
) increased with increasing x-dependent QW depth. Time-resolved differential transmission measurements mapped the carrier relaxation mechanisms and explained the dependence of I<sub>th</sub>
on x. Carriers are captured from the barriers to the QWs in <1 ps, while carrier recombination rates increased with increasing x. For excitation above I<sub>th</sub>
, an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing I<sub>th</sub>
. © 2003 American Institute of Physics.</div>
</front>
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<fA11 i1="01" i2="1"><s1>OZGUR (Umit)</s1>
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on x. Carriers are captured from the barriers to the QWs in <1 ps, while carrier recombination rates increased with increasing x. For excitation above I<sub>th</sub>
, an additional, fast relaxation mechanism appears due to the loss of carriers in the barriers through a cascaded refilling of the QW state undergoing SE. The increased material inhomogeneity with increasing x provides additional relaxation channels outside the cascaded refilling process, removing carriers from the SE process and increasing I<sub>th</sub>
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